US Patent Issued to Microtest on Dec. 23 for "Burn-in station for performing burn-in testing of electronic devices" (Italian Inventor)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,464, issued on Dec. 23, was assigned to Microtest S.p.A. (Vicopisano, Italy).

"Burn-in station for performing burn-in testing of electronic devices" was invented by Giuseppe Amelio (San Pietro, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "A burn-in station (BIS) for performing burn-in testing of electronic devices, comprising: a main frame; a plurality of burn-in drivers (BIDs) embedded in the main frame and each including a plurality of slots; wherein each of the slots receives a burn-in board (BIB) meant to accommodate a plurality of devices to be tested; wherein each of the slots comprises a slot cover which, in an operative condition, to...