ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,215, issued on Sept. 30, was assigned to Micron Technology Inc. (Boise, Idaho).
"Dynamic read calibration" was invented by Li-Te Chang (San Jose, Calif.), Aaron Lee (Sunnyvale, Calif.), Zhenming Zhou (San Jose, Calif.) and Murong Lang (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a memory device with multiple cells and a processing device to perform operations including: identifying a group of wordlines, each connected to a subset of cells, and assigning a specified charge loss classification value to that group. The operations can also include selecting a page level, selecting a first set of cells, determining,...