ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,424,297, issued on Sept. 23, was assigned to Micron Technology Inc. (Boise, Idaho).
"Error control for memory device" was invented by Nobuo Yamamoto (Nerima, Japan), Donald Martin Morgan (Meridian, Idaho), Victor Wong (Boise, Idaho) and Jongtae Kwak (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for error control for memory device are described. A memory device may be configured to perform memory management operations including error control operations. For example, a memory device may be configured to perform an error control operation on data stored in a first memory cell coupled with a source row of a memo...