US Patent Issued to Micron Technology on Sept. 2 for "Memory die fault detection using a calibration pin" (Idaho, Minnesota Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,856, issued on Sept. 2, was assigned to Micron Technology Inc. (Boise, Idaho).

"Memory die fault detection using a calibration pin" was invented by Scott E. Schaefer (Boise, Idaho) and Paul A. Laberge (Shoreview, Minn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for memory die fault detection using a calibration pin are described. A memory device may perform a calibration procedure on a first resistor of each of a set of memory dies of a memory module using a pin coupled with the memory module. The memory device may couple the pin to a second resistor of a memory die of the set of memory dies based on the memory die ...