US Patent Issued to Micron Technology on Sept. 2 for "Determining offsets for memory read operations" (Chinese, American Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,406,738, issued on Sept. 2, was assigned to Micron Technology Inc. (Boise, Idaho).

"Determining offsets for memory read operations" was invented by Jie Zhou (Shanghai), Xiangang Luo (Fremont, Calif.), Min Rui Ma (Shanghai) and Guang Hu (Mountain View, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for determining offsets for memory read operations are described. In response to a threshold quantity of pages failing initial reads but being successfully read using a same reference adjustment during re-reads, the offset responsible for the adjustment may be used as a first-applied offset for subsequent re-reads or a base...