US Patent Issued to Micron Technology on Oct. 7 for "Corrective program verify operation with improved read window budget retention" (California Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,818, issued on Oct. 7, was assigned to Micron Technology Inc. (Boise, Idaho).

"Corrective program verify operation with improved read window budget retention" was invented by Ching-Huang Lu (Fremont, Calif.), Hong-Yan Chen (San Jose, Calif.) and Yingda Dong (Los Altos, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A program operation is initiated to program a set of target memory cells of a target wordline of a memory device to a target programming level. During a program verify operation of the program operation, a program verify voltage level is caused to be applied to the target wordline to verify programming of the set of target memory ce...