US Patent Issued to Micron Technology on Oct. 21 for "Bootloader failure analysis of memory system" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,450,115, issued on Oct. 21, was assigned to Micron Technology Inc. (Boise, Idaho).

"Bootloader failure analysis of memory system" was invented by Jianping Tian (Shanghai) and Da Hong (SanYang, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments described herein provide for bootloader failure analysis of a memory system using information regarding a failure of the bootloader, where the information is stored on the memory sub-system in response to detection of (e.g., stored at the time of) the failure. In particular, the stored information can comprise data that would be lost or otherwise inaccessible for subsequent diagnostic (e.g., ...