US Patent Issued to Micron Technology on Oct. 14 for "Reducing read error handling operations during power up of a memory device" (California Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,444,475, issued on Oct. 14, was assigned to Micron Technology Inc. (Boise, Idaho).

"Reducing read error handling operations during power up of a memory device" was invented by Dongxiang Liao (Cupertino, Calif.) and Tomer Tzvi Eliash (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A boot-up read pattern data structure is maintained. Each entry of the boot-up read pattern data structure comprises a boot-up read pattern associated with a respective power cycle event and a dummy boot-up read pattern flag. The dummy boot-up read pattern flag indicates that the boot-up read pattern has been consecutively used during boot-up. Storing, in a ne...