ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,693, issued on Nov. 4, was assigned to Micron Technology Inc. (Boise, Idaho).
"Temperature monitoring for memory devices" was invented by Aaron P. Boehm (Boise, Idaho), Todd Jackson Plum (Boise, Idaho), Scott D. Van De Graaff (Boise, Idaho), Scott E. Schaefer (Boise, Idaho) and Mark D. Ingram (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for temperature monitoring for memory devices are described for monitoring one or more temperature ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device with...