US Patent Issued to Micron Technology on Nov. 4 for "Systems and methods for improved dual-tail latch with load control" (Idaho Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,868, issued on Nov. 4, was assigned to Micron Technology Inc. (Boise, Idaho).

"Systems and methods for improved dual-tail latch with load control" was invented by Jinha Hwang (Boise, Idaho) and Won Joo Yun (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes an interface configured to receive clock signals and data signals. The interface includes a dual-tail latch. The dual-tail latch includes a sensing stage configured to sense and to amplify a differential voltage between at least a portion of the data signals and another signal. The sensing stage includes a first node and a second node between which the ampl...