US Patent Issued to Micron Technology on Nov. 4 for "System for predicting properties of structures, imager system, and related methods" (Idaho, Utah Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,370, issued on Nov. 4, was assigned to Micron Technology Inc. (Boise, Idaho).

"System for predicting properties of structures, imager system, and related methods" was invented by Amitava Majumdar (Boise, Idaho), Qianlan Liu (Boise, Idaho), Pradeep Ramachandran (Lehi, Utah), Shawn D. Lyonsmith (Boise, Idaho), Steve K. McCandless (Nampa, Idaho), Ted L. Taylor (Boise, Idaho), Ahmed N. Noemaun (Boise, Idaho) and Gordon A. Haller (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of predicting virtual metrology data for a wafer lot that includes receiving first image data from an imager system, the first image data relating to at least ...