ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,661, issued on Nov. 4, was assigned to Micron Technology Inc. (Boise, Idaho).
"Dynamic block categorization to improve reliability and performance in memory sub-system" was invented by Sandeep Reddy Kadasani (Meridian, Idaho), Pitamber Shukla (San Jose, Calif.), Scott Anthony Stoller (Boise, Idaho) and Niccolo' Righetti (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "A set of threshold voltage distribution width measurements are obtained for a block in a memory device. An endurance estimate is determined for the block based on the threshold voltage distribution width measurements. The endurance estimate comprises an indication of an esti...