US Patent Issued to Micron Technology on Nov. 25 for "Optimizing data reliability using erase retention" (American, Japanese Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,481,426, issued on Nov. 25, was assigned to Micron Technology Inc. (Boise, Idaho).

"Optimizing data reliability using erase retention" was invented by Zhongguang Xu (San Jose, Calif.), Ronit Roneel Prakash (Hiratsuka, Japan), Murong Lang (San Jose, Calif.), Ching-Huang Lu (Fremont, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and apparatuses include moving a portion of memory to a garbage pool in response to determining that the portion of memory is invalid. The portion of memory is erased in response to determining that the portion of memory is invalid. A request to move an additional port...