ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,875, issued on Nov. 11, was assigned to Micron Technology Inc. (Boise, Idaho).
"Multi-sensor test device for quality control scanning" was invented by Theodore G. Doros (Fairfax, Va.).
According to the abstract* released by the U.S. Patent & Trademark Office: "In some implementations, a test device may initiate a set of measurements by a set of sensors of the test device and of a device under test (DUT), wherein the DUT is a memory device. The test device may obtain the set of measurements of the DUT from the set of sensors based on initiating the set of measurements. The test device may analyze the set of measurements of the DUT, using a first model, to identify one or more defe...