ALEXANDRIA, Va., June 10 -- United States Patent no. 12,292,831, issued on May 6, was assigned to Micron Technology Inc. (Boise, Idaho).
"Enhanced data reliability in multi-level memory cells" was invented by Deping He (Boise, Idaho) and David Aaron Palmer (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for enhanced data reliability in multi-level memory cells are described. For a write operation, a host device may identify a first set of data to be stored by a set of memory cells at a memory device. Based on a quantity of bits within the first set of data being less than a storage capacity of the set of memory cells, the host device may generate a second set of dat...