ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,580, issued on May 27, was assigned to Micron Technology Inc. (Boise, Idaho).
"Built-in self-test circuitry" was invented by William Yu (Boise, Idaho), Daniele Balluchi (Cernusco Sul Naviglio, Italy), Danilo Caraccio (Milan), Thomas T. Tangelder (Boise, Idaho), Jacob S. Robertson (Caldwell, Idaho), James G. Steele (Boise, Idaho) and Joemar Sinipete (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices related to built-in self-test (BIST) circuitry of a controller. The controller can be coupled to multiple memory devices. The BIST circuitry can include registers configured to store burst patterns. The BIST circuit...