ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,121, issued on May 20, was assigned to Micron Technology Inc. (Boise, Idaho).
"Filtering metrics associated with memory" was invented by Dung Viet Nguyen (San Jose, Calif.), Shantilal Rayshi Doru (San Diego), Jun Wan (San Jose, Calif.) and Sampath Ratnam (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "In some implementations, a controller of a memory device may obtain a first metric associated with a memory of the memory device using a first memory read configuration. The controller may apply a function to the first metric to obtain a second memory read configuration. The controller may obtain a second metric associated with the mem...