US Patent Issued to Micron Technology on May 20 for "Evaluation of memory device health monitoring logic" (Idaho Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,731, issued on May 20, was assigned to Micron Technology Inc. (Boise, Idaho).

"Evaluation of memory device health monitoring logic" was invented by Scott E. Schaefer (Boise, Idaho), Aaron P. Boehm (Boise, Idaho), Todd Jackson Plum (Boise, Idaho), Mark D. Ingram (Boise, Idaho) and Scott D. Van De Graaff (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for evaluation of memory device health monitoring logic are described. A memory device may include health monitoring logic that is operable to be enabled in a configuration that corresponds to an output, such as an expected output, regardless of a degradation le...