US Patent Issued to Micron Technology on May 13 for "Performing memory testing using error correction code values" (Singaporean, American Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,300,339, issued on May 13, was assigned to Micron Technology Inc. (Boise, Idaho).

"Performing memory testing using error correction code values" was invented by Kok Hua Tan (Singapore), Chee Hock Ngo (Singapore) and Michael T. Brady (Loveland, Colo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a memory component and a processing device operatively coupled with the memory component. The processing device performs a test of the memory component by generating an error correction code (ECC) value for an initial operation of the test based on an address in the memory component on which the initial operation of the test is performed, gener...