US Patent Issued to Micron Technology on May 13 for "Early stopping of bit-flip low density parity check decoding based on syndrome weight" (Canadian, American Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,301,254, issued on May 13, was assigned to Micron Technology Inc. (Boise, Idaho).

"Early stopping of bit-flip low density parity check decoding based on syndrome weight" was invented by Eyal En Gad (Santa Clara, Calif.), Mustafa N. Kaynak (San Diego), Yoav Weinberg (Toronto), Zhengang Chen (San Jose, Calif.) and Sivagnanam Parthasarathy (Carlsbad, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processing device in a memory sub-system determines a syndrome weight for a sense word read from a memory device and determines whether the syndrome weight for the sense word satisfies a threshold criterion. Responsive to the syndrome weight for the sense...