US Patent Issued to Micron Technology on March 4 for "Adaptive enhanced corrective read based on write and read temperature" (California Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,242,755, issued on March 4, was assigned to Micron Technology Inc. (Boise, Idaho).

"Adaptive enhanced corrective read based on write and read temperature" was invented by Zhenming Zhou (San Jose, Calif.), Murong Lang (San Jose, Calif.), Ching-Huang Lu (Fremont, Calif.) and Nagendra Prasad Ganesh Rao (Folsom, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including: receiving a request to perform a read operation on a segment of the memory device; determining whether a temperature offset value of the segment satisfies a thre...