US Patent Issued to Micron Technology on June 3 for "Controlling variation of valid data counts in garbage collection source blocks" (California, Minnesota, Idaho Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,321,266, issued on June 3, was assigned to Micron Technology Inc. (Boise, Idaho).

"Controlling variation of valid data counts in garbage collection source blocks" was invented by Xiangyu Tang (San Jose, Calif.), David Ebsen (Minnetonka, Minn.), Ying Huang (Boise, Idaho) and Sundararajan Sankaranarayanan (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A subset of blocks from a set of blocks of a memory device are identified based on a valid data count constraint. A first block from the subset of blocks is selected based on a valid data count of the first block. A second block from the subset of blocks is selected based on a data temperatur...