ALEXANDRIA, Va., June 25 -- United States Patent no. 12,340,126, issued on June 24, was assigned to Micron Technology Inc. (Boise, Idaho).
"Workload-based scan optimization" was invented by Kishore Kumar Muchherla (San Jose, Calif.), Eric N. Lee (San Jose, Calif.), Jeffrey S. McNeil (Nampa, Idaho), Jonathan S. Parry (Boise, Idaho) and Lakshmi Kalpana Vakati (Fremont, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method performed by a processing device receives a plurality of write operation requests, where each of the write operation requests specifies a respective one of the memory units, identifies one or more operating characteristic values, where each operating characteristic value reflects one...