US Patent Issued to Micron Technology on June 24 for "Indicating a status of a memory built-in self-test using a data mask inversion bit" (Idaho Inventor)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,340,860, issued on June 24, was assigned to Micron Technology Inc. (Boise, Idaho).

"Indicating a status of a memory built-in self-test using a data mask inversion bit" was invented by Scott E. Schaefer (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations described herein relate to performing a memory built-in self-test and indicating a status of the memory built-in self-test using a data mask inversion (DMI) bit. A memory device may read one or more bits, associated with a memory built-in self-test, that are stored in a mode register of the memory device. The memory device may identify a first DMI bit of the memory device that is...