US Patent Issued to Micron Technology on June 17 for "Single-level cell program-verify, latch-limited data recovery" (California Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,163, issued on June 17, was assigned to Micron Technology Inc. (Boise, Idaho).

"Single-level cell program-verify, latch-limited data recovery" was invented by Eric N. Lee (San Jose, Calif.) and Tomoko Ogura Iwasaki (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Control logic in a memory device identifies memory cells of a memory array configured as single-level cell (SLC) memory, where the memory cells include two or more memory cells programmed during a program phase and associated with a selected wordline of the memory array. The control logic further causes a program verify voltage to be applied to the selected wordline during a...