ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,175, issued on June 17, was assigned to Micron Technology Inc. (Boise, Idaho).
"Differential strobe fault indication" was invented by Scott E. Schaefer (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for differential strobe fault indication are described. A memory device may be configured to indicate a fault using a read strobe signal. The read strobe signal may be a read data strobe (RDQS) signal, such as a true RDQS (RDQS_t) signal or a complement RDQS (RDQS_c) signal. In some examples, the memory device may indicate the fault based on a characteristic of the read strobe signal, such as a pattern of the r...