US Patent Issued to Micron Technology on June 10 for "Adjustment of code rate as function of memory endurance state metric" (California, Idaho Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,782, issued on June 10, was assigned to Micron Technology Inc. (Boise, Idaho).

"Adjustment of code rate as function of memory endurance state metric" was invented by Kishore Kumar Muchherla (San Jose, Calif.), Niccolo' Righetti (Boise, Idaho), Sivagnanam Parthasarathy (Carlsbad, Calif.), Mustafa N. Kaynak (San Diego), Mark A. Helm (Santa Cruz, Calif.), James Fitzpatrick (Laguna Niguel, Calif.) and Ugo Russo (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes determining, by a processing device, a value of a memory endurance state metric associated with a segment of a memory device in a memory sub-system; determining a targ...