US Patent Issued to Micron Technology on July 8 for "Test circuit using clock signals having mutually different frequency" (Japanese Inventor)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,354,686, issued on July 8, was assigned to Micron Technology Inc. (Boise, Idaho).

"Test circuit using clock signals having mutually different frequency" was invented by Yutaka Uemura (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is an apparatus that includes first and second shift register circuits coupled in series, the first and second shift register circuits being configured to perform a shift operation of a trigger signal in synchronization with a clock signal, and a clock control circuit configured to set a frequency of the clock signal to a first frequency when the trigger signal is in the first shift register cir...