US Patent Issued to Micron Technology on July 29 for "Validating read level voltage in memory devices" (American, Italian Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,373,109, issued on July 29, was assigned to Micron Technology Inc. (Boise, Idaho).

"Validating read level voltage in memory devices" was invented by Jeffrey S. McNeil (Nampa, Idaho), Eric N. Lee (San Jose, Calif.), Vamsi Pavan Rayaprolu (Santa Clara, Calif.), Sivagnanam Parthasarathy (Carlsbad, Calif.), Kishore Kumar Muchherla (San Jose, Calif.), Patrick R. Khayat (San Diego) and Violante Moschiano (Avezzano, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "Described are systems and methods for validating read level voltage in memory devices. An example memory device comprises: a memory array comprising a plurality of memory cells electrically coupl...