US Patent Issued to Micron Technology on July 29 for "Monitoring memory device health according to data storage metrics" (California Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,373,111, issued on July 29, was assigned to Micron Technology Inc. (Boise, Idaho).

"Monitoring memory device health according to data storage metrics" was invented by Tingjun Xie (Milpitas, Calif.), Seungjune Jeon (Santa Clara, Calif.), Zhenlei Shen (Milpitas, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A plurality of memory device life metrics are determined, where one of the plurality of memory device life metrics comprises a read count metric that specifies a number of read operations performed on the memory device. A plurality of normalized metric values are calculated, where each of the normalized metr...