ALEXANDRIA, Va., July 16 -- United States Patent no. 12,362,032, issued on July 15, was assigned to Micron Technology Inc. (Boise, Idaho).
"Error detection for a semiconductor device" was invented by Matthew Young (Allen, Texas) and John E. Riley (McKinney, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure includes apparatus, methods, and systems for error detection for a semiconductor device. An apparatus includes a memory array, a detector array, and a detector coupled to the detector array. The detector is configured to detect an error in a portion of the detector array and output an output signal to memory components coupled to the detector array in response to detecting the err...