US Patent Issued to Micron Technology on July 1 for "Machine learning assisted read verify in a memory sub-system" (Indian Inventor)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,347,503, issued on July 1, was assigned to Micron Technology Inc. (Boise, Idaho).

"Machine learning assisted read verify in a memory sub-system" was invented by Amit Bhardwaj (Hyderabad, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A command to migrate data from a source address to a destination address is detected. One or more parameters associated with the source address are provided as input to a trained machine learning model. A read verify relevance if received as output from the trained machine learning model. Responsive to determining that the read verify relevance satisfies a condition, the command is performed to migrate the data."

The ...