US Patent Issued to Micron Technology on July 1 for "Apparatus with memory cell calibration mechanism and methods for operating the same" (Singaporean, American Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,346,588, issued on July 1, was assigned to Micron Technology Inc. (Boise, Idaho).

"Apparatus with memory cell calibration mechanism and methods for operating the same" was invented by Yee Yang Tay (Singapore), Lei Zhang (Singapore), Steve Kientz (Westminster, Colo.) and Edric Goh (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, apparatuses and systems related to tracking charge loss are described. An apparatus may include a tracking mechanism configured to make direct measurements for tracking charge loss in first-type cells. The apparatus may be configured to designate a set of the first-type cells as proxy for modeling charge loss at ...