US Patent Issued to Micron Technology on Jan. 28 for "Test mode state machine for a memory device" (California Inventors)

ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,766, issued on Jan. 28, was assigned to Micron Technology Inc. (Boise, Idaho).

"Test mode state machine for a memory device" was invented by Rucha Deepak Geedh (Folsom, Calif.), Manjinder Singh Bains (Yuba City, Calif.) and Roopal Amit Patel (Folsom, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems, methods, and apparatus for a memory device having test mode state machines configured to perform self-testing. In one approach, a memory array has memory cells. Periphery logic of the memory device receives a command from a host device to initiate self-testing. The periphery logic generates trigger signal(s) in response to receiving the comm...