US Patent Issued to Micron Technology on Jan. 20 for "Temperature profile tracking for adaptive data integrity scan rate in a memory device" (California, Idaho Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,127, issued on Jan. 20, was assigned to Micron Technology Inc. (Boise, Idaho).

"Temperature profile tracking for adaptive data integrity scan rate in a memory device" was invented by Saeed Sharifi Tehrani (San Diego) and Christopher M. Smitchger (Garden City, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems, methods, and apparatus related to controlling media scan in memory devices. In one approach, a controller manages a media scanning process for a memory (e.g., NAND flash memory) as a function of temperature. The controller collects temperature data from one or more sensors of the memory. Using the collected temperature data, the cont...