US Patent Issued to Micron Technology on Jan. 20 for "Single-bit error indication for a memory built-in self-test" (Idaho Inventor)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,139, issued on Jan. 20, was assigned to Micron Technology Inc. (Boise, Idaho).

"Single-bit error indication for a memory built-in self-test" was invented by Scott E. Schaefer (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations described herein relate to single-bit error indication for a memory built-in self-test. A memory device may read one or more bits, associated with a memory built-in self-test, that are stored in a mode register of the memory device. The memory device may perform the memory built-in self-test for one or more memory sections of the memory device based on reading the one or more bits that are stored in th...