ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,304, issued on Jan. 13, was assigned to Micron Technology Inc. (Boise, Idaho).
"Reliability based data verification" was invented by Yu-Chung Lien (San Jose, Calif.), Ankit V. Vashi (San Jose, Calif.), Zhenming Zhou (San Jose, Calif.) and Jung Sheng Hoei (Newark, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes designating a first subset of non-volatile memory with a first reliability designation, designating a second subset of non-volatile memory blocks with a second reliability designation, configuring the first subset of non-volatile memory blocks and the second subset of non-volatile memory blocks in a first verification m...