ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,315, issued on Jan. 13, was assigned to Micron Technology Inc. (Boise, Idaho).
"Efficient read disturb scanning" was invented by Chun Sum Yeung (San Jose, Calif.), Deping He (Boise, Idaho) and Zhongyuan Lu (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for efficient read disturb scanning are described. A memory system may limit a quantity of word lines scanned as part of a read disturb scan. For example, the memory system may select a threshold quantity of word lines of a block for the read disturb scan based on a characterization of the word lines, such as selecting one or more word lines having higher bi...