US Patent Issued to Micron Technology on Jan. 13 for "Commands for testing error correction in a memory device" (German Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,990, issued on Jan. 13, was assigned to Micron Technology Inc. (Boise, Idaho).

"Commands for testing error correction in a memory device" was invented by Francesco Lupo (Munich).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems, methods, and apparatus related to error correction in memory devices. In one approach, a memory device uses dedicated op-codes to generate, during programming operations, a pattern including known requested data errors. During reading operations on the memory device, the calibrated errors will be detected by the ECC engine of the memory device as read errors. This permits a host device to observe, in a controlled environ...