US Patent Issued to Micron Technology on Jan. 13 for "Apparatuses and methods for bounded fault compliant metadata storage" (Idaho Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,298, issued on Jan. 13, was assigned to Micron Technology Inc. (Boise, Idaho).

"Apparatuses and methods for bounded fault compliant metadata storage" was invented by Sujeet Ayyapureddi (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatuses, systems, and methods for bounded fault compliant metadata storage. Memory devices include a first data terminal and a second data terminal. As part of an access operation a first set of data and a first set of metadata may be sent/received across the first terminal and a second set of data and a second set of metadata may be sent/received across the second terminal. The first set of metadata may...