ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,217,806, issued on Feb. 4, was assigned to Micron Technology Inc. (Boise, Idaho).
"Techniques for threshold voltage scans" was invented by Aniello Palomba (Marigliano, Italy), Ciro Feliciano (Casandrino, Italy) and Antonio Imperiale (Caserta, Italy).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for threshold voltage scans are described. A memory device may receive a configuration for scanning a memory array during a scanning procedure. The memory device may read, during the scanning procedure, one or more memory cells of the memory array using a first voltage value that is indicated by the configuration. The memory device ma...