US Patent Issued to Micron Technology on Feb. 4 for "Fault tolerant artificial neural network computation in deep learning accelerator having integrated random access memory" (California Inventor)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,217,159, issued on Feb. 4, was assigned to Micron Technology Inc. (Boise, Idaho).

"Fault tolerant artificial neural network computation in deep learning accelerator having integrated random access memory" was invented by Poorna Kale (Folsom, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems, devices, and methods related to a Deep Learning Accelerator and memory are described. For example, an integrated circuit device may be configured to execute instructions with matrix operands and configured with random access memory (RAM) to store parameters of an artificial neural network (ANN). The device can generate random bit errors to simulate compro...