ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,216,915, issued on Feb. 4, was assigned to Micron Technology Inc. (Boise, Idaho).
"Adaptive read disturb scan" was invented by Animesh R. Chowdhury (Boise, Idaho), Kishore K. Muchherla (San Jose, Calif.), Nicola Ciocchini (Boise, Idaho), Akira Goda (Setagaya, Japan), Jung Sheng Hoei (Newark, Calif.), Niccolo' Righetti (Boise, Idaho) and Jonathan S. Parry (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatuses, systems, and methods for adapting a read disturb scan. One example method can include determining a delay between a first read command a second read command, incrementing a read count based on the determined delay between the first...