US Patent Issued to Micron Technology on Feb. 3 for "Read level calibration with information collection skipping" (Idaho, California Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,191, issued on Feb. 3, was assigned to Micron Technology Inc. (Boise, Idaho).

"Read level calibration with information collection skipping" was invented by Sean Brasfield (Boise, Idaho), Chong Giap Chiew (San Jose, Calif.) and Tawalin Opastrakoon (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments provide for performing a read voltage level calibration process with selective skipping collection of calibration-related information on a memory device of a memory system, such as a memory sub-system. For example, some embodiments provide for performing a coarse threshold estimate (CTE) calibration process, with selective skipp...