ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,237,033, issued on Feb. 25, was assigned to Micron Technology Inc. (Boise, Idaho).
"Component overprovisioning in layered devices" was invented by Domenico Balzano (Torre Annunziata, Italy) and Enrico Camillo Beretta (Sengkang, Singapore).
According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations described herein relate component overprovisioning in layered devices. In some implementations, a test device may include one or more components configured to perform, on a set of memory components of a memory device, a set of production tests. The one or more components may be configured to identify, based on the set of production tests, a failure of a memo...