ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,229,062, issued on Feb. 18, was assigned to Micron Technology Inc. (Boise, Idaho).
"Erroneous select die access (SDA) detection" was invented by Yang Lu (Boise, Idaho), Creston M. Dupree (Boise, Idaho) and Kang-Yong Kim (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Described apparatuses and methods relate to erroneous select die access (SDA) detection for a memory system. A memory system may include a memory controller and a memory device that are capable of implementing an SDA protocol that enables selective memory die access to multiple memory devices that couple to a command bus. A memory device can include logic that determines if sig...