US Patent Issued to Micron Technology on Feb. 10 for "Reuse of bad blocks for tasks in a memory sub-system" (Idaho, Colorado Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,332, issued on Feb. 10, was assigned to Micron Technology Inc. (Boise, Idaho).

"Reuse of bad blocks for tasks in a memory sub-system" was invented by Robert Mason (Boise, Idaho), Pitamber Shukla (Boise, Idaho), Scott Anthony Stoller (Boise, Idaho), Stuart A. Bell (Berthoud, Colo.) and Dennis J. Borgonos (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "A failure of a block among a set of blocks of a memory device of a memory sub-system is detected. Based on detecting the failure of the block, the block is evaluated for reuse. The block is designated for reuse based on a result of the evaluating of the block. The block is allocated to a ta...