US Patent Issued to Micron Technology on Dec. 30 for "Temperature change measurement to detect attack" (California, Washington, Idaho Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,378, issued on Dec. 30, was assigned to Micron Technology Inc. (Boise, Idaho).

"Temperature change measurement to detect attack" was invented by Aaron P. Boehm (Boise, Idaho), David Hulton (Seattle), Jeremy Chritz (Seattle), Tamara Schmitz (Scotts Valley, Calif.) and Max S. Vohra (Seattle).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for temperature change measurement to detect an attack on a memory device are described. A memory device may measure a rate of change for temperature readings at a dynamic random access memory (DRAM) component of the memory device (e.g., using sensors at the DRAM component). The memory dev...