US Patent Issued to Micron Technology on Dec. 30 for "Interposers for memory device testing and characterization, including interposers for testing and characterizing decision feedback equalization circuitry of DDR5 memory devices" (Idaho Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,179, issued on Dec. 30, was assigned to Micron Technology Inc. (Boise, Idaho).

"Interposers for memory device testing and characterization, including interposers for testing and characterizing decision feedback equalization circuitry of DDR5 memory devices" was invented by Eric J. Stave (Meridian, Idaho), Luis Nathan Perez Acosta (Boise, Idaho) and Bryce A. Gardiner (Meridian, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Interposers for use in testing and characterizing memory devices, such as memory devices including decision feedback equalization circuitry, are disclosed herein. In one embodiment, an apparatus includes an interposer having...