US Patent Issued to Micron Technology on Dec. 30 for "Defective memory unit screening in a memory system" (California Inventor)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,177, issued on Dec. 30, was assigned to Micron Technology Inc. (Boise, Idaho).

"Defective memory unit screening in a memory system" was invented by Alex Frolikov (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory system having non-volatile media and a controller configured to process requests from a host system to store data in the non-volatile media or retrieve data from the non-volatile media. The non-volatile media has a set of memory units. The memory system stores an indicator indicating whether the memory system is operating in a user mode or a manufacturing mode. A defect manager of the memory system identifies a thresh...